DEFINITY Enterprise Communications Server Release 7
Maintenance for R7r
555-230-126
Issue 4
June 1999
Maintenance Commands
8-329test ds1-loop
8
Parameters
Examples
test ds1-facility 04a01d
test ds1-facility 03a01a sh c
test ds1-loop
test ds1-loop
- For TN464F or TN767E or later suffix DS1 Interface circuit packs.
This command is used for loopback and one-way span testing of the DS1 span.
Synopsis
test ds1-loop location [cpe-loopback-jack-test-begin [number-of-bits
bit-pattern] | far-csu-loopback-test-begin | one-way-span-test-begin |
end-loopback/span-test | inject-single-bit-error | ds1/csu-loopback-tests]
Permissions
Logins with the following service levels may execute this command: system
technician, inads, init, super-user, or logins with Maintain Switch Circuit Packs
permissions enabled.
Examples
test ds1-loop 01c08
test ds1-loop 1-3c03 cpe-loopback-jack
test ds1-loop 1-3c03 cpe
test ds1-loop 10c03 end
test ds1-loop 02d12 fa
test ds1-loop 02d12 inj
UUCSSf
A DS1 facility is specified by the location of the DS1 Converter circuit pack
and a letter from
a
to
d
corresponding to the four facilities connected to the
circuit pack.
external
loopback
This specifies a destructive test that sends a test pattern to an external
device and returns it for comparison to the original. Configure the external
device to loop back the signal. See “DS1-FAC (DS1 Facility)” and
“DS1C-BD (DS1 Converter)” in Chapter 9.
