DEFINITY Enterprise Communications Server Release 7
Maintenance for R7r
555-230-126
Issue 4
June 1999
Maintenance Object Repair Procedures
9-700DUP-CHL (Duplication Interface)
9
Three Maintenance Objects are involved in the maintenance of the Duplication
Interface circuit packs and their cabling: DUPINT, DUP-CHL, and SPE-SELE.
DUPINT runs tests that check the operation of the active Duplication Interface
circuit pack. DUP-CHL tests overall functionality of the circuit packs. This utilizes
both circuit packs, their cabling, and communication with the standby software.
SPE-SELE monitors the position of the select switches located on the front of the
Duplication Interface circuit packs.
Testing is directional from the active Duplication Interface circuit pack to the
standby Duplication Interface circuit pack. If an interchange has occurred with
alarms raised against DUPINT or DUP-CHL, testing cannot resolve or clear these
alarms because they are against the wrong circuit packs in the active to standby
directional configuration. An interchange is needed to allow testing to resolve or
clear these directional alarms.
DUP-CHL tests
Eight tests run under this MO. Four of these (Status Register Comparison, SMM
Channel, Remote SPE Error, and Memory Shadowing) are run at system
initialization, during short and long demand testing, and during periodic and
scheduled testing. Three other tests (Remote Loop-Around, State-of-Health, and
Memory Shadowing Disable) are run only at initialization time (reset system 2 or
higher) and during long demand testing. The FIFO Full destructive test is run only
as a long demand test.
For long demand testing use
test duplication-interface long clear
. The clear
option is needed to clear alarms for error types that don’t have an associated
test. Since these tests require the turning on and off of memory shadowing, you
must enter the command
busyout spe
before the long sequence can be run.
Busying out the SPE turns off memory shadowing but handshake communication
continues between the SPEs. After testing of DUP-CHL is complete,
release spe
must be entered before memory shadowing is turned on and refresh completes.
Memory shadowing is not turned back on if DUPINT, DUP-CHL or other MAJOR
alarms pertinent to memory shadowing are not retired. See Chapter 1 and
STBY-SPE for details.
test dup
and
test dup long
run DUPINT
and
DUP-CHL tests. This is the only
command that runs short and long test sequences for these maintenance
objects.
Replacement procedures for the standby Duplication Interface circuit pack, the
active Duplication Interface circuit pack, and the interconnecting cable appear at
the end of this section (DUP-CHL). These procedures are designed to prevent
disruption of customer service (except when the active Duplication Interface
circuit pack must be replaced due to shadowing failure). Each procedure also
describes testing after replacement to verify duplication operation when either
SPE carrier is active. Test failures in a procedure may direct you to another
maintenance object for repairs.
