DEFINITY Enterprise Communications Server Release 7
Maintenance for R7r
555-230-126
Issue 4
June 1999
Maintenance Object Repair Procedures
9-701DUP-CHL (Duplication Interface)
9
Administration
No
add
or
remove
commands are associated with the Duplication Interface
circuit packs.
In-line errors
If standby SPE software detects problems with the standby Duplication Interface
circuit pack, it will report these via the handshake to the active. The report will
indicate one of the following:
— An error in reading or writing one or more of the registers on the circuit
pack
— A problem with local loop around test
— A problem with the HFAIL bit being set
The last error is a bit set by the Duplication Interface circuit pack’s hardware
indicating a possible problem with the multiplexing of address and data during
memory shadowing. No tests can retire these alarms reported by standby
software. If the software stops reporting the errors, the alarms will be retired in
about 15 minutes.
Other types of in-line errors are catastrophic ones resulting from FIFO overflow or
Remote SPE Error interrupts. If these errors cause an alarm, shadowing will be
turned off until the alarm is resolved. Alarms from these errors and the other
in-line errors can be resolved by executing
test duplication-interface long clear
with no tests failing.
MAJOR vs. MINOR alarms
DUP-CHL may have MAJOR or MINOR alarms. MAJOR alarms cause memory
shadowing to be turned off. MINOR Alarms do not. DUP-CHL alarms do not lower
the Standby State of Health and do not cause an SPE interchange.
Tests run by DUP-CHL are directional in nature: they are run by the active SPE on
the standby SPE. Failures of these tests are logged against the standby
Duplication Interface circuit pack. Consequently, should an interchange occur,
alarms logged against DUP-CHL associated with the formerly standby, now
active SPE can not be resolved. An interchange is required to allow testing to
resolve or clear these directional alarms.
MO interactions
test duplication-interface runs DUPINT and DUP-CHL non-destructive tests.
test duplication-interface long clear runs DUPINT and DUP-CHL destructive
and non-destructive tests, and requires that the standby SPE be busied out.
Busying out the standby SPE turns off memory shadowing and lowers the health
of the standby to
partially-functional
. This prevents an SPE interchange.
